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Showing results: 1336 - 1350 of 1531 items found.

  • Three-Phase Relay Protection Tester

    GDJB-PC - Chongqing Gold Mechanical & Electrical Equipment Co.,Ltd

    1.GDJB-PC Universal Secondary Injection Relay Test Set is applied to test the relay unit in relay protection system. 2.At the same time GDJB-PC Universal Secondary Injection Relay Test Set could be considered as a universal three phase AC/DC voltage source or current source. 3.It can work alone or connected to computer, inside the relay controller there are new speed digital signal mini PC and real DAC (Digital-to-Analog Converter) template with new high fidelity and high power, the machine has large panel screen and rotating mouse. It is small in volume, high precision.

  • Bipolar/FET/Diode Dual Head Production Test System

    36XX - FETservice, Inc

    Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.

  • Multi-Channel Digital Power Meters

    Chroma 66203/66204 - Chroma Systems Solutions, Inc.

    Chroma’s Digital Power Meters are designed for both single-phase and multiple phase measurements of AC power signals and related parameters common to most electronic products. Instead of traditional analog measurement circuits the 66200 Digital Power Meter uses state-of-the-art DSP digitizing technology. The internal 16 bits analog/digital converters with sampling rates of up to 200KHz provide both high speed and high accuracy measurements which is unprecedented within the industry for this class of power meters current on the market.

  • Difference Amplifiers

    Analog Devices Inc.

    A difference amplifier is a special purpose amplifier designed to measure differential signals, otherwise known as a subtractor. A key feature of a difference amplifier is its ability to remove unwanted common mode signals, known as common mode rejection (CMR). Unlike most types of amplifiers, difference amplifiers are typically able to measure voltages beyond the supply rails, and are used in applications where large dc or ac common-mode voltages are present. They are ideal for current and voltage monitoring. Analog Devices offers a range of difference amplifiers, optimized for low distortion, low power, or high voltage performance.

  • Digital Panel Meter

    Nippen Electrical Instruments Co.

    To be supplied with the right meter, simply furnish the following details in your order: Model Number, Description of the Meter. Accuracy Class. Voltage Input (110 Volts from PT, 240 Volts line to neutral or 415 Volts Line to Line). PT Ratio specifies the High Voltage Primary first ( 33 kV.110V). Current input (5Amps or 1 Amp secondary ) CT ratio (e.g. 100/5 Amps. etc.). Aux. Supply : 50/60 Hz (240VAC of 110/VAC). Dimension : 96 x 96mm or 48 x 96 mm or 144 x 144 mm.

  • ECT / ECA Eddy Current Flaw Detector

    EVi - United Western Technologies Corp

    The EVi works directly with the EddyView Family of probes and accessories. UniWest’s unmatched selection of standard and advanced display features set a new standard for flexibility of applications, ease of use, interpretation of data and overall operator accuracy. The key to the EVi’s ground-breaking performance is the display of a visual image of the surface area under inspection alongside the customary and selectable eddy current signal displays (impedance plane, A-scan or strip charts). The EVi provides a high precision, easily readable display of surface conditions enabling improved interpretation of data while giving more accurate discernment of cracks, pits, gouges and fretting.

  • Electrochemistry Research Equipment

    NuVant Systems, Inc.

    Our electrochemical equipment will help your group achieve laboratory and research goals. The best-selling EZstat Pro potentiostat/galvanostat can run cyclic voltammetry, electrochemical impedance spectroscopy (EIS), battery tests, and high speed galvanostatic intermittent titration technique (GITT). The EZstat HV potentiostat delivers up to 1 amp at 25 volts. The Powerstat comes in two configurations (5 amp vs 20 amp). The Duostat bipotentiostat can operate rotating ring-disk electrode experiments. The Arraystat and ArrayPGstat feature multichannel operation with different customizable options (current range, number of channels, etc.).

  • Rad Hard GaN Drivers

    Renesas Electronics Corp.

    The space market has been driving towards more efficient power management solutions. Part of the drive includes the use of Gallium Nitride Field Effect Transistors (GaN FETs) for power conversion. GaN FETs have higher power conversion efficiency and have more natural immunity to radiation, due to them being wide-bandgap semiconductors. Equally important is the use of the correct driver that will allow reliable operation and maximize the benefits of the GaN FETs. Some of the key driver requirements are: a well-regulated gate drive voltage; high source/sink current capability and a split driver output stage.

  • DM 150-Watt Transmitter

    Loc-150Tx - Vivax-Metrotech Corp

    The Loc-150Tx, 150-Watt DM Transmitter is used primarily with the Defect Mapper (DM) Receiver, however it is also useful for those needing a low frequency, high output transmitter. Typically, the Loc-150Tx, transmitter (DM transmitter) is used to apply a signal current to the anode bed. The pipeline returns the signal via coating faults back to the transmitter. The Loc-150Tx transmitter is designed to be powered from CP (Cathodic Protection) stations, AC or external batteries, eliminating the need for internal batteries. This transmitter has a direct connection mode to apply the locate frequency onto the conductor.  There is no clamp or induction mode.

  • EIS Battery Analyzer

    BA8100 - B&K Precision Corporation

    The BA8100 is designed to accurately measure the internal impedance of a single cell or battery stack with voltages as high as 80 V. In addition to impedance, auxiliary measurements include voltage, current, phase, capacitance, inductance, quality factor and more. With the provided software, the BA8100 can perform Electrochemical Impedance Spectroscopy (EIS) across a frequency range of 50 mHz to 10 kHz. The impedance spectrum can be evaluated through the Nyquist and Bode plot tools to determine effective series resistance (ESR) and track battery health. Included with the BA8100 is a self-test fixture to verify the instrument’s performance or compensate for resistance introduced by the test leads.

  • High Voltage 50 Ω Pulse Generator

    TLP-8010C - High Power Pulse Instruments GmbH

    *Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components

  • High Voltage 50 Ω Pulse Generator

    TLP-12010A - High Power Pulse Instruments GmbH

    - High pulse output current up to ±120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time- Wafer, package and system level TLP and HMM testing- 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)- 1 built-in pulse width: 100 ns- Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient software for system control and waveform data management- The software can control automatic probers for fast measurements of complete wafers- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface

  • DC Power Supply

    WPS Series - Matrix Technology Inc.

    The WPS Series programmable DC power supply is a high-precision, wide range of voltage & current within the power rating of the power supply, full-featured high power density programmable DC Power Supplies. It can provide wide-range, low-ripple and stable DC output which is used for DC input products and components function testing and experimental simulation.

  • Laser Diode Testing

    Yelo Ltd.

    The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.

  • Cryogenic Applications

    Celadon

    Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.

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